ATE IC Test Sockets for Memory Testing - 30K-50K Insertion Cycles, ±0.01mm Tolerance

Name: ATE IC Test Sockets for Memory Testing - 30K-50K Insertion Cycles, ±0.01mm Tolerance
Brand: Sireda Technology Co., Ltd.

High-performance ATE IC test sockets designed for automated final test applications. Features precision pogo pin contacts, 30K-50K insertion cycles, broad package compatibility (BGA, QFN, SOP), and custom configurations for DRAM, Flash, and SoC testing. Ideal for high-volume production with reliable electrical performance.

Brand Name Sireda

Compatible Packages: BGA, QFN, LGA, SOP, WLCSP

Socket Type Open Top

Place of Origin China

Price Get Quote

Minimum Order Quantity 1

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Product Description

High-Performance ATE IC Test Sockets

Premium ATE IC test sockets engineered specifically for automated test equipment (ATE) systems in Final Test (FT) stages, delivering ultra-reliable contact performance for memory, logic, and high-volume production testing.

Socket Configurations

ATE IC Test Socket with Two DUT configuration

Two DUT Socket

ATE IC Test Socket with One DUT configuration

One DUT Socket

Key Features & Benefits

Optimized for Automated Handling - Designed for seamless integration with pick-and-place ATE systems to maximize throughput
Precision Test Contacts - High-cycle pogo pin or spring probe options ensure stable electrical connections through thousands of test cycles
FT-Stage Reliability - Rigorously validated for use in final test (FT) processes where signal integrity and repeatability are critical
Memory & Production-Ready - Ideal for DRAM, Flash, SoC, and other high-volume ICs requiring consistent validation
Superior Durability - Built for high-cycle testing with robust materials that withstand thousands of insertions
Broad Compatibility - Supports BGA, QFN, SOP, and other IC packages
Custom Configurations - Tailored test fixtures for unique IC designs and testing requirements
Thermal & High-Frequency Options - Specialized sockets for burn-in, high-temp, and RF testing

Technical Specifications

IC Test Socket technical diagram and specifications

Property	Parameter	Typical Value
Mechanical	Insertion Cycles	≥30K-50K cycles
	Contact Force	20-30g/pin
	Operating Temperature	Commercial -40°C ~ +125°C Military -55°C ~ +130°C
	Tolerance	±0.01mm
	Electrical	Contact Resistance	<50mΩ
Impedance		50Ω (±5%)
Current		1.5A~3A

Application Solutions

Whether you're validating prototypes, programming ICs, or running high-volume production tests, our custom test sockets ensure accuracy and repeatability. Engineered for challenging environments, our sockets feature robust mechanical designs to prevent warping under thermal stress while maintaining stable contact resistance. Compatible with automated handlers and testers, they streamline your validation process while cutting downtime.

For more options or custom requests, see the details below or get in touch with our engineers.