Basic-type Atomic Force Microscope

Name: Basic-type Atomic Force Microscope
Brand: Truth Instruments Co., Ltd.

Product Name Basic-type Atomic Force Microscope - AtomExplorer Product Introduction The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force

Brand Name Truth Instruments

Payment Terms T/T

Place of Origin CHINA

Price Price Negotiable | Contact us for a detailed quote

Minimum Order Quantity 1

Model Number AtomExplorer

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Product Description

Product Name

Basic-type Atomic Force Microscope - AtomExplorer

Product Introduction

The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Kelvin Force Microscopy (KFM), and Atomic Force Microscopy (AFM). It offers high stability, excellent expandability, and customization services. As a high-precision topography characterization tool and a device for high-nanoscale magnetic and electrical measurements, it provides additional options and support for education, scientific research and industrial R&D.

Equipment Performance

Item	Details
Sample Size	Φ 25 mm
Scanning Method	XYZ Three-Axis Full-Sample Scanning
Scanning Range	100 μm×100 μm×10 μm / 30 μm×30 μm×5 μm
Z-Axis Noise Level	0.04 nm
Tip Protection Technology	Safe Needle Insertion Mode
Image Sampling Points	32×32-4096×4096
Operating Mode	Tap Mode, Contact Mode,Lift Mode, Phase Imaging Mode
Multifunctional Measurements	Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM)