China Wafer-Level Atomic Force Microscoperoscope for sale

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Wafer-Level Atomic Force Microscoperoscope

Name: Wafer-Level Atomic Force Microscoperoscope
Brand: Truth Instruments Co., Ltd.

Wafer-Level Atomic Force Microscope Product Model: Atommax Product Overview: Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations

Brand Name Truth Instruments

Payment Terms T/T

Sample Size Compatible with 8-inch wafers and below

Place of Origin CHINA

Scan Speed 0.1Hz-30Hz

Price Price Negotiable | Contact us for a detailed quote

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Product Description

Wafer-Level Atomic Force Microscope

Product Model:

Atommax

Product Overview:

Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments.

Equipment Performance Specifications

Parameter	Specification
Sample Size	Compatible with 8-inch wafers and below
Scanning Range	Maximum 100μm * 100μm * 910μm
Scanning Angle	0~360"
Resolution	Z-axis closed-loop resolution 0.15 nm; X/Y closed-loop resolution 0.5 nm
Scanning Probe XY Direction lmage Resolution	Not less than 32x32~4000x4000
Operating Modes	Contact mode, tapping mode, phase imaging mode, lift mode, multi-directional scanning mode
Multi-Function Measurement	EFM,KFM,PFM,MFM