China SN74BCT8374ADWRG4 for sale
China SN74BCT8374ADWRG4 for sale

SN74BCT8374ADWRG4

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

Operating Temperature 0°C ~ 70°C
Category Integrated Circuits (ICs) Logic Specialty Logic
Description IC SCAN TEST DEVICE 24SOIC
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Mounting Type Surface Mount
Product Status Obsolete
Product Description

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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