SN74BCT8374ADWRE4
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Operating Temperature
0°C ~ 70°C
Category
Integrated Circuits (ICs)
Logic
Specialty Logic
Description
IC SCAN TEST DEVICE W/FF 24-SOIC
Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Mounting Type
Surface Mount
Model Number
SN74BCT8374ADWRE4
Product Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
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