Optical Mag Adujestable manual probe station specialized testing device

Optical Mag Adujestable Manual Probe Station Specialized Testing Device

Mag Probe station manual adujestable probe station

A probe station is a specialized testing device used in the semiconductor industry to measure the electrical properties of individual components on a semiconductor wafer. It consists of a base with a flat surface, on which the wafer is placed, and a set of probes that make contact with the components on the wafer.

The probes are mounted on a moveable arm that can be adjusted manually or through a computer-controlled system to position the probes precisely over the components to be tested. The probes are typically made of tungsten or other conductive materials, and they are very small, with tips that can be as small as a few microns in diameter.