ZEIT SI200-150 Structured Light Surface Shape Detection Equipment 200x150mm
High-precision optical testing equipment for lamp reflector, wafer flatness, and surface defect detection. Features ±3μm absolute error, adjustable 0.25mm resolution, and ISO certification. Custom production available from manufacturer with 24-hour response.
Structural Light Large Size Surface Shape Detection Equipment
Applications
Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection.
Working Principle
The display projects the structured light in stripe form, and the camera collects the structured light from the measured
surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution
and curvature distribution of the measured surface are calculated according to the deformation of the stripe, then the
surface shape error distribution can be obtained by comparing point cloud distribution with ideal model.
Features
| Model | SI200-150 |
| Measuring range | 200×150mm2 |
| Transverse resolution | Conventional 0.25mm, adjustable |
| Measuring precision | Absolute error: ±3μm (100mm in diameter) |
| Note: Customized production available. | |
Detection Image
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