China IEC 60335 Access Probe Kit Access and Object Testing Probe for sale
China IEC 60335 Access Probe Kit Access and Object Testing Probe for sale

IEC 60335 Access Probe Kit Access and Object Testing Probe

Meets GB4706.1-2005. Accessibility probes are used to test the size of openings to ensure that fingers and objects do not have access to hazardous parts in equipment and machinery. SPECIFICATIONS 1. Jointed Finger Probe: Precision probe which follows IEC specifications and meets the newest requirements. The design features a plan simulator to prevent misuse and a restricted joint movement which simulates human finger movement. This model meets CSA, IEC, UL and other industry

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